2013-2014/2011-2012/2009-2010/2007-2008/2006-2005/2004-2003/2002-2001
International conference

2010
  1. M. Hada and J. Matsuo
    gUltrafast optical actuation of VO2 thin film accompanied by the structural phase transition"
    1st CFEL Symposium, (Sylt Germany, 2011/03/18, Poster)


  2. J. Matsuo, Y. Wakamatsu, T. Seki and T. Aoki
    gMolecular Imaging of Cells and Tissues by Wet-SIMS" Using Swift Heavy Ion Beamsh
    20th MRS-J SymposiumiInternational Sessionj (Yokohama, Japan, 2010/12/21, Oral)

  3. K. Ichiki, S. Ninomiya, T. Seki, T. Aoki and J. Matsuo
    gThe effects of cluster size on sputtering and surface smoothing with gas cluster ion beamsh
    20th MRS-J SymposiumiInternational Sessionj (Yokohama, Japan, 2010/12/22, Poster)

  4. T. Aoki, T. Seki and J. Matsuo
    gMD Simulation of Huge Fluorine Cluster Impact on Siliconh
    20th MRS-J SymposiumiInternational Sessionj (Yokohama, Japan, 2010/12/22, Poster)

  5. Y. Yamamoto, K. Ichiki, T. Seki, T. Aoki and J. Matsuo
    gEvaluation of Damage Depth on Organic Materials Surfaces with Molecular Depth Profiling by Ar Clusterh
    20th MRS-J SymposiumiInternational Sessionj (Yokohama, Japan, 2010/12/22, Poster)

  6. T. Seki, Y. Yoshino, T. Senoo, K. Koike, T. Aoki and J. Matsuo
    gHigh-speed Si etching with ClF3 neutral cluster beamh
    20th MRS-J SymposiumiInternational Sessionj (Yokohama, Japan, 2010/12/22, Poster)

  7. J. Matsuo, H. Yamada, Y. Wakamatsu, T. Aoki and T. Seki
    gA Novel Molecular Imaging Technique for Biological Material Analysish
    AVS 57th International Symposium (New Mexico, USA, 2010/10/20, Oral)

  8. J. Matsuo
    gWhat Size of Cluster Ion Is Most Appropriate for SIMS? h
    ASTM Workshop on Surface Analysis (New Mexico, USA, 2010/10/17, Invited)

  9. J. Matsuo
    gNovel primary ion beams for bio-SIMSh
    5th International Symposium on Practical Surface Analysis (PSA-10), (Gyeongju, Korea, 2010/10/5, Invited)

  10. J. Matsuo
    gCharacterization of cells and tissues by "wet-SIMS" using swift heavy ion beamsh
    10th European Conference on Accelerators in Applied Reserch and Technology (ECAART2010), (Athenes, Greece, 2010/9/15, Oral)

  11. J. Matsuo
    gMolecular Imaging Technique with swift heavy ionsh
    The 3rd Workshop on Interaction of Ions with Insulators (WIII2010), (Narita, Japan, 2010/9/4, Invited)

  12. K. Ichiki, S. Ninomiya, T. Seki, T. Aoki and J. Matsuo
    gThe effects of cluster size and energy on surface smoothing with gas cluster ion beamsh
    17th International Conference on Ion Beam Modification of Materials (IBMM2010), (Montreal, Canada, 2010/8/23, Poster)


  13. J. Matsuo
    gLarge Size Cluster Ion Beams:from Fundamental Aspects to Industrial Applicationsh
    21th International Conference on the Application of Accelerators in Research and Industry, (Fort Worth, Texas, USA, 2008/8/11, Invited)

  14. J. Matsuo
    gBiological Material Analysis with Swift Heavy Ions:A Proposal of gWet SIMSh
    21th International Conference on the Application of Accelerators in Research and Industry, (Fort Worth, Texas, USA, 2008/8/11, Invited)

  15. J. Matsuo, H. Yamada, Y. Wakamatsu, S. Ninomiya, T. Seki, T. Aoki
    gMolecular Imaging of Biological Samples with Swift Heavy Ion Microprobeh
    12th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA 2010) (Leipzig, German, 2010/07/27, Invited)

  16. Y. Wakamatsu, H. Yamada, S. Ninomiya, T. Seki, T. Aoki, J. Matsuo
    gBiomuolecular Analysis with Nuclear Microprobe under Near-ambient Conditionsh
    12th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA 2010) (Leipzig, German, 2010/07/27, Poster)

  17. G. Sciaini, M. Hada, J. Matsuo, A. Karantza, G. Moriena and R. J. D. Miller
    gCoherent Acoustic Phonons in Highly Oriented Bismuth Films Mon-itored by Femtosecond Electron Diffractionh
    Ultrafast Phenomena 17 (USA, 2010/7/23, Oral)

  18. T. Aoki, T. Seki and J. Matsuo
    gMD Simulation of Huge Reactive Gas Cluster Impact with Supersonic Velocityh
    10th International Conference on Computer Simulations of Radiation Effects in Solids (Krakow, Poland, 2010/7/18, Oral)

  19. S. Ninomiya, K. Ichiki, T. Seki, T. Aoki and J. Matsuo
    gCharacteristics of organic depth profiling using large cluster ion beamsh
    10th Workshop on Cluster Ion Beam Technology (Kyoto, Japan, 2010/6/14, Oral)

  20. T. Aoki, T. Seki and J. Matsuo
    gMD simulation of small boron cluster implantationh
    10th Workshop on Cluster Ion Beam Technology (Kyoto, Japan, 2010/6/14, Oral)

  21. K. Ichiki, S. Ninomiya, T. Seki, T. Aoki and J. Matsuo
    gThe effects of incident cluster size and energy on Si sputtering yieldh
    10th Workshop on Cluster Ion Beam Technology (Kyoto, Japan, 2010/6/14, Oral)

  22. T. Seki, T. Aoki and J. Matsuo
    gEtching Characteristics with Ar-Cl2 Gas Mixed Cluster Ion Beamh
    10th Workshop on Cluster Ion Beam Technology (Kyoto, Japan, 2010/6/14, Oral)

  23. T. Aoki, T. Seki and J. Matsuo
    gDamage and sputtering with cluster impact by MD simulationsh
    The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-12) (Seikei Univ. Japan, 2010/6/11, Oral)

  24. S. Ninomiya, K. Ichiki, T. Seki, T. Aoki and J. Mastuo,
    gAvailability of gas cluster SIMS to biomolecular analysish
    The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-12) (Seikei Univ. Japan, 2010/6/11, Oral)


  25. S. Ninomiya, K. Ichiki, T. Seki, T. Aoki and J. Matsuo
    gSecondary ion mass spectrometry depth profiling of organic materials with large gas cluster ion beamsh
    18th International Conference on Ion Implantation Technology (Kyoto University, Japan, 2010/6/9, Oral)


  26. T. Yamanobe, Y. Yamamoto, K. Ichiki, S. Ninomiya, T. Seki, T. Aoki and J. Matsuo
    gDevelopment of high-intensity Ar cluster ion beam equipmenth
    18th International Conference on Ion Implantation Technology (Kyoto University, Japan, 2010/6/8, Poster)

  27. M. Hada, S. Ibuki, S. Ninomiya, T. Seki, T. Aoki and J. Matsuo
    gEvaluation of damage layer in an organic film with irradiation of energetic ion beamsh
    18th International Conference on Ion Implantation Technology (Kyoto University, Japan, 2010/6/8, Poster)

  28. Y. Yoshino, T. Seki, T. Senoo, K. Koike, S. Ninomiya, T. Aoki and J. Matsuo
    gHigh Speed Si Etching with ClF3 Cluster Injectionh
    18th International Conference on Ion Implantation Technology (Kyoto University, Japan, 2010/6/8, Poster)

  29. K. Ichiki, S. Ninomiya, T. Seki, T. Aoki and J. Matsuo
    gSize and energy dependence of the sputtering yield of Si bombarded with gas cluster ion beamsh
    18th International Conference on Ion Implantation Technology (Kyoto University, Japan, 2010/6/7, Poster)

  30. Y. Yamamoto, K. Ichiki, S. Ninomiya, T. Seki, T. Aoki and J. Matsuo
    gDamage evaluation of organic materials irradiated with Ar cluster ion beamh
    18th International Conference on Ion Implantation Technology (Kyoto University, Japan, 2010/6/7, Poster)

  31. Y. Wakamatsu, H. Yamada, S. Ninomiya, T. Seki, T. Aoki and J. Matsuo
    gSIMS with Fast Heavy Ions for Biomolecule Analysish
    18th International Conference on Ion Implantation Technology (Kyoto University, Japan, 2010/6/7, Poster)

  32. J. Matsuo, Y. Wakamatsu, H. Yamada, S. Ninomiya, T. Seki and T. Aoki
    gWet SIMS with Swift Heavy Ions for Biological Material Analysish
    22nd Annual Workshop on SIMS (Norfolk, USA, 2010/5/21, Oral)

  33. J. Matsuo, K. Ichiki, S. Ninomiya, T. Seki and T. Aoki
    gMeasurement of Cluster Size Dependence of Sputtering Yield Using Size-Selected Ar Cluster Ion Beamsh
    22nd Annual Workshop on SIMS (Norfolk, USA, 2010/5/20, Oral)

  34. S. Ninomiya, K. Ichiki, T. Seki, T. Aoki and J. Matsuo
    gDepth profile characteristics of organic materials with large Ar cluster ion beamsh
    22nd Annual Workshop on SIMS (Norfolk, USA, 2010/5/19, Oral)

  35. T. Aoki, T. Seki and J. Matsuo
    gMD simulation of small boron cluster implantationh
    10th International Workshop on Junction Technology (Fudan University, China, 2010/5/10-11)


2009
  1. G. Moriena, M. Hada , J. Matsuo , C. Lu, Hubert Jean-Ruel, M. Gao, R. Cooney, A. Karantza, G. Sciaini and R.J.D.Miller
    gCoherent acoustic phonons in ultrathin monocrystalline Bismuthh
    The Banff Meeting on Structural Dynamics (Banff, Canada, 2010/2/26, Poster)


  2. M. Hada and J. Matsuo
    gEvaluation of Lattice Motion with Vacuum-free Compact Designed Time-resolved X-ray Diffraction h
    The Banff Meeting on Structural Dynamics (Banff, Canada, 2010/2/26, Poster)


  3. J. Matsuo and M. Hada
    gIn-air femtosecond X-ray sourceh
    The Banff Meeting on Structural Dynamics (Banff, Canada, 2010/2/25, Oral)

  4. J. Matsuo
    gSIMS with Highly Excited Primary Beamsh
    ALCf09 (Maui, Hawaii, USA, 2009/12/10, Keynote)

  5. T. Seki and J. Matsuo
    gInvestigation of Irradiation Damage with Large Gas Cluster Ion Beam using by HR-RBSh
    ALCf09 (Maui, Hawaii, USA, 2009/12/10, Oral)


  6. T. Aoki and J. Matsuo
    gMolecular Dynamics Simulation of Cluster Impact with Composite Speciesh
    19th MRS-J Symposium(Yokohama, Japan, 2009/12/9, Oral)

  7. S. Ninomiya, K. Ichiki, H. Yamada, Y. Nakata, T. Seki, T. Aoki and J. Matsuo
    gMolecular depth profiling of biological materials with large Ar cluster ion beamsh
    19th MRS-J Symposium (Yokohama, Japan, 2009/12/9, Oral)

  8. T. Yamanobe, Y. Yamamoto, K. Ichiki, S. Ninomiya, T. Seki, T. Aoki and J. Matsuo
    gDevelopment of high-intensity Ar Cluster ion beam sourceh
    19th MRS-J Symposium (Yokohama, Japan, 2009/12/8, Poster)

  9. T. Seki, Y. Yamamoto, K. Ichiki, S. Ninomiya and J. Matsuo
    gSoft Excitation and Processing of Polymer Materials with Cluster Ion Beamsh
    International Symposium on the Physics of Excitation-assisted Nano-processes(ISPEN2009) (Wakayama, Japan, 2009/11/20, Poster)

  10. M. Hada and J. Matsuo
    gEffect of ambient pressure on Cu Kƒ¿ X-ray radiation with millijoule and high-repetition-rate femtosecond laserh
    International Symposium on the Physics of Excitation-assisted Nano-processes(ISPEN2009) (Wakayama, Japan, 2009/11/20, Poster)

  11. S. Ninomiya, K. Ichiki, H. Yamada, T. Seki, T. Aoki and J. Matsuo
    gSecondary ion mass spectrometry depth profiling of organic films with large Ar cluster ion beamsh
    5th Inaternational Workshop on High-Resolution Depth Profiling (Kyoto, Japan, 2009/11/18, Oral)

  12. T. Seki, T. Aoki and J. Matsuo
    gInvestigation of cluster ion irradiation damage with HR-RBSh
    5th Inaternational Workshop on High-Resolution Depth Profiling (Kyoto, Japan, 2009/11/17, Poster)

  13. J. Matsuo, S. Ninomiya, K. Ichiki, H. Yamada, M. Hada, T. Aoki and T. Seki
    gSurface Damage Evaluation of Organic Materials Irradiated with Ar Cluster Ionsh
    AVS 56th International Symposium (California, USA, 2009/11/12, Oral)

  14. J. Matsuo
    Nanoprocessing with Cluster Beams-Challenges and Opportunities
    31st International Symposium on Dry Process (Busan, Korea, 2009/9/24, Invited)

  15. K. Ichiki, S. Ninomiya, Y. Nakata, H. Yamada, T. Seki, T. Aoki and J. Matsuo
    Sputtering and morphology of solid surfaces bombarded with size-selected gas cluster ion beams
    16th International Conference on Surface Modification of Materials by Ion Beams (SMMIB2009) (AIST Tokyo Waterfront, Japan, 2009/9/16, Oral)

  16. T. Seki, T. Aoki and J. Matsuo
    Etching of Metallic Materials with Cl2 Gas Cluster Ion Beam
    16th International Conference on Surface Modification of Materials by Ion Beams (SMMIB2009) (AIST Tokyo Waterfront, Japan, 2009/9/16, Poster)

  17. Y. Yamamoto , K. Ichiki, S. Ninomiya, T. Seki and J. Matsuo
    Damage evaluation of polymer materials irradiated with Ar cluster ion beams
    16th International Conference on Surface Modification of Materials by Ion Beams (SMMIB2009) (AIST Tokyo Waterfront, Japan, 2009/9/16, Poster)

  18. S. Ninomiya, K. Ichiki, H. Yamada, Y. Nakata, T. Seki, T. Aoki and J. Matsuo
    Molecular depth profiling of polymers with large Ar cluster ion beams
    17th International Conference on Secondary Ion Mass Spectrometry (Toronto, Canada, 2009/9/18, Oral)

  19. J. Matsuo
    SIMS with large size cluster ions: Recent Advances and Challenges
    17th International Conference on Secondary Ion Mass Spectrometry (Toronto, Canada, 2009/9/16, Invited)

  20. BN. Jones, J. Matsuo, Y. Nakata, H. Yamada, JF. Watts, S. Hinder, RP. Webb
    Comparison of MeV monomer ion and Cluster SIMS
    17th International Conference on Secondary Ion Mass Spectrometry (Toronto, Canada, 2009/9/16, Oral)

  21. S. Ninomiya, K. Ichiki, H. Yamada, Y. Nakata, T. Seki, T. Aoki and J. Matsuo
    Analysis of organic semiconductor multilayers with Ar cluster SIMS
    17th International Conference on Secondary Ion Mass Spectrometry (Toronto, Canada, 2009/9/15, Oral)

  22. J. L. S. Lee, S. Ninomiya, J. Matsuo, I. S. Gilmore, A. G. Shard, M. P. Seah
    Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions |A preliminary study
    17th International Conference on Secondary Ion Mass Spectrometry (Toronto, Canada, 2009/9/15, Oral)

  23. S. Ninomiya, K. Ichiki, H. Yamada, Y. Nakata, T. Seki, T. Aoki and J. Matsuo
    Damage evaluation of organic samples under large Ar cluster ion bombardment
    17th International Conference on Secondary Ion Mass Spectrometry (Toronto, Canada, 2009/9/14, Oral)

  24. M. Hada, S. Ninomiya, T. Seki, T. Aoki and J. Matsuo
    Evaluation of optical properties in organic films with irradiation of cluster ion beams
    17th International Conference on Secondary Ion Mass Spectrometry (Toronto, Canada, 2009/9/14, Poster)

  25. K. Ichiki, S. Ninomiya, T. Seki, T. Aoki and J. Matsuo
    Size effects of sputtering yields with large cluster ion beams
    17th International Conference on Secondary Ion Mass Spectrometry (Toronto, Canada, 2009/9/14, Poster)

  26. Y. Nakata, H. Yamada, S. Ninomiya, T. Seki, T. Aoki and J. Matsuo
    Matrix-assisted Molecular Emission under MeV Ion Bombardment
    17th International Conference on Secondary Ion Mass Spectrometry (Toronto, Canada, 2009/9/14, Poster)

  27. Y. Nakata, H. Yamada, J. Tamura, S. Ninomiya, T. Seki, T. Aoki and J. Matsuo
    Wet-SIMS with Swift Heavy Ions for Biological Applications
    Y. Nakata, H. Yamada, S. Ninomiya, T. Seki, T. Aoki and J. Matsuo
    17th International Conference on Secondary Ion Mass Spectrometry (Toronto, Canada, 2009/9/14, Poster)

  28. H. Yamada, Y. Nakata, S. Ninomiya, T. Seki, T. Aoki and J. Matsuo
    MeV-Energy Probe SIMS Imaging of Pretreated Animal Cells
    17th International Conference on Secondary Ion Mass Spectrometry (Toronto, Canada, 2009/9/14, Poster)

  29. T. Aoki, T. Seki and J. Matsuo
    Study of atomic mixing and migration by low-energy ion irradiation using MEIS and MD simulation
    19th Ion Beam Analysis (University of Cambridge, UK, 2009/9/7, Poster)

  30. J. Matsuo
    Molecular Imaging Technique with Swift Heavy Ions
    19th Ion Beam Analysis (University of Cambridge, UK, 2009/9/7, Invited)

  31. H. Yamada, Y. Nakata, S. Ninomiya, T. Seki, T. Aoki and J. Matsuo
    MeV-Energy Probe SIMS Imaging of Major Components in Washed, Etched or Fractured Animal Cells
    19th Ion Beam Analysis (University of Cambridge, UK, 2009/9/7, Poster)

  32. T. Aoki and J. Matsuo
    Computer simulation of gas cluster ion impact
    19th International Conference on Ion-Surface Interctions 2009 (Zvenigorod, Russia, 2009/8/21-25, Invited)

  33. M. Hada and J. Matsuo
    gDevelopment of Ultrafast Pulse X-ray Source in Ambient Pressure with a Millijoule High Repetition Rate Femtosecond Laserh
    Zero-Carbon Energy Kyoto (Kyoto, Japan, 2009/8/20, Poster)


  34. J. Matsuo, H. Yamada, K. Ichiki, M. Hada, S. Ninomiya, T. Seki and T. Aoki
    Material processing and evaluation with cluster ion beam
    10th International Symposium on Sputtering & Plasma Process (Kanazawa, Japan, 2009/7/8, Invited)

  35. T. Aoki and J. Matsuo
    Study of Damage Accumulation and Annealing Process at Low Energy Boron Implantation Using Molecular Dynamics Simulations
    9th International Workshop on Junction Technology (Kyoto University, 2009/6/12, Oral)

  36. J. Matsuo, K. Ichiki, M. Hada, S. Ninomiya, T. Seki, T. Aoki, T. Nagayama and M. Tanjo
    Stress Measurement of Carbon Cluster implanted layers with in-plane Diffraction Technique
    9th International Workshop on Junction Technology (Kyoto University, 2009/6/12, Oral)

  37. S. Ninomiya,
    TOF-SIMS and depth profile analysis of organic films with Ar cluster ion beams
    The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (Seikei University, 2009/6/11, Oral)

  38. J. Matsuo, T. Nagayama and M. Tanjo
    Characterization of implanted layers obtained with cluster ions of varing size.
    International Workshop on INSIGHT-2009 (Embassy Suites, Napa, CA, 2009/4/27, Poster)

  39. T. Aoki, T. Seki and J. Matsuo
    Molecular dynamics study of surface modification with large cluster ion impact.
    2009 MRS spring meeting (San Francisco, CA, 2009/4/16, Poster)

  40. K. Ichiki, S. Ninomiya, M. Hada, T. Seki, T. Aoki and J. Matsuo
    Size-selected high density large gas cluster ion beam irradiation.
    2009 MRS spring meeting (San Francisco, CA, 2009/4/16, Poster)

  41. J. Matsuo
    Nano Fabrication and Evaluation with Advanced Quantum Beam.
    2009 MRS spring meeting (San Francisco, CA, 2009/4/17, Invited)