2015-2016/2013-2014/2011-2012/2009-2010/2007-2008/2006-2005/2004-2003/2002-2001
International conference

 

2016
  1. J.Matsuo,M.Kusakari,M.Fujii,T.Seki,T.Aoki,
    "Chemical analysis under ambient conditions using swift heavy ion beams"
    12th European Conference on Acceleratorsin Applied Research and Technology
    (University of Jyväskylä,Finland,2016/7/7)Oralnew

  2. J.Matsuo
    "Secondary ion emission from organic materials using swift heavy ions"
    27thINTERNATIONAL CONFERENCE ON ATOMIC COLLISIONS IN SOLIDS(ICACS-27)(IMP,Lanzhou,China,2016/7/28)Invitednew

  3. J.Matsuo
    "Chemical analysis with nuclear micro probe: Current achievement and future potential"
    15thInternational Conference on Nuclear Microprobe Technology and ApplicationsICNMTA 2016(IMP,Lanzhou,China,2016/8/1)Oralnew

  4. J.Matsuo
    "SIMS system for molecular imaging"
    20th International Vacuum Congress (IVC-20)(BEXCO,Busan,Korea,2016/8/23)Invitednew

     

2015
  1. Jiro Mastuo
    "Cluster Ion Beam from eV to MeV"
    7th Asian Forum for Accelerators and Detectors 
    (Uji Campus, Kyoto University, Kyoto, Japan 2016/2/2,Oral)

  2. Jiro Matsuo
    "ScienceAmbient-SIMS: A New Probe for Liquid-Solid Interfaces"
    SAOG 2016 32nd Annual Meeting of the Swiss Working Group for Surface and Interface
    (Universit de Fribourg, Switzerland 2016/1/22,Invited)

  3. Jiro Matsuo
    "toward Ambient Analysis"
    IAEA 2nd Research Coordination Meeting on Development of molecular concentration
    mapping techniques using MeV focused ion beams Progress Report on MeV-SIMS in Kyoto University. (2015.11.17/Oral)

  4. T. Seki, Y. Yoshino, T. Senoo, K. Koike, T. Aoki and J. Matsuo
    “Reactive etching with ClF3-Ar neutral cluster beam”
    The 37th International Symposium on Dry Process(DPS2015)
    (2015, 11.5 Awaji Yumebutai International Conference Center, AwajiIsland Japan)Oral

  5. J.Matsuo
    "Exploring of Organic Surfaces with Secondary Ion Mass Spectrometry: From Polymers to Biological Materials"
    ALC '15. 10th International Symposium on Atomic Level Characterizations for New Materials and Devices
    (Kunibiki Messe, Matsue, Shimane, JAPAN.2015.10.27)Plenary

  6. T.Seki, M. Kusakari, M. Fujii, T. Aoki and J. Matsuo
    "Solid-Liquid Interface Analysis with MeV-Energy Heavy Ion Beams
    "ALC'15 10th International Symposium on Atomic Level Characterizations for New Materials and Devices'15, (28a-B-8), (2015. 10.28) @Matsue, Shimane, Japan, (oral).

  7. M.Fujii, T. Seki, T. Aoki and J. Matsuo
    "Evaluation on organic analysis with a novel SIMS apparatus using model standard sam ples"
    ALC'15 10th International Symposium on Atomic Level Characterizations for New Materials and Devices'15, (27p-P-22) , (2015.10.27) @Matsue, Shimane, Japan, (poster).

  8. K.Suzuki, M. Kusakari, M. Fujii, T. Seki, T. Aoki and J. Matsuo
    "Development of Low-Pressure SIMS Instruments with Large Cluster Ion Beam"
    ALC'15 10th International Symposium on Atomic Level Characterizations for New Materials and Devices'1 5, (27p-P-13), (2015.10.27) @Matsue, Shimane, Japan, (poster).

  9. J.Matsuo
    “Secondary Molecular Ion Emission from Liquids under Ambient Pressure”
    21st International Workshop on Inelastic Ion-Surface Collisions (IISC-21)
    (2015, 10.20 Donostia-San Sebastián, Spain)Poster

  10. J.Matsuo
    "Secondary Molecular Ion Emission with Swift Heavy Ions under Ambient Pressure"
    REM8 Eighth International meeting on Recent Developments in the Study of Radiation Effects in Matter (Kerteminde, Denmark,2015/9/21)Oral

  11. J.Matsuo
    “An Evolution in SIMS Instruments: How Far arewe from the Goal?, “
    SIMS XX 20th International Conference on Secondary Ion Mass Spectrometry (Seattle, 2015/9/15)
    Invited

  12. M. Fujii, T. Seki, T. Aoki, J. Matsuo,
    “Current Prospects of Organic Analysis with Ar-GCIB SIMS,
    from Synthetic Polymers and Organic Devices toward BiologicalMaterials,“
    SIMS XX 20th International Conference on Secondary Ion Mass Spectrometry (Seattle, 2015/9/14)Oral

  13. Hubert Gnaser, M. Kusakari, M. Fujii, T. Seki, T. Aoki, J. Matsuo,
    "Molecular Cluster Emission in Sputtering of Amino Acids by Argon Gas-cluster Ions, "
    SIMS XX 20th International Conference on Secondary Ion Mass Spectrometry (Seattle, 2015/9/14)Oral

  14. M. Kusakari, M. Fujii, T. Seki, T. Aoki, J. Matsuo,
    "Development of Ambient SIMS using MeV-energy ion probe, "
    SIMS XX 20th International Conference on Secondary Ion Mass Spectrometry (Seattle, 2015/9/14)Oral

  15. A.Karen, M. Fujii, T. Seki, T. Aoki, J. Matsuo,
    "Comparative Study of Dual and Single Beam Analysis Techniques for Biological Materials, "
    SIMS XX 20th International Conference on Secondary Ion Mass Spectrometry (Seattle, 2015/9/17)Poster

  16. R. Shishido, M. Fujii, T. Seki, T. Aoki, J. Matsuo, S. Suzuki,
    "Influences of Yield and Damage Cross-Section on Imaging Analysis of Organic Molecules by
    Bi cluster TOF-SIMS, " SIMS XX 20th International Conference on Secondary Ion Mass Spectrometry
    (Seattle, 2015/9/17)Poster

  17. S. Aoyagi, Y. Yokoyama, M.Fujii, J.Matsuo, J.S. Fletcher, N.P. Lockyer,
    "The Influence of Primary Ion Beam Energy on Peptide Fragmentation by Means of ToF-SIMS
    Using Huge Cluster Ion Sources,"
    SIMS XX 20th International Conference on Secondary Ion Mass Spectrometry (Seattle, 2015/9/16)Oral

  18. M. Fujii, R. Shishido, T. Satoh, T. Seki, T. Aoki, S. Suzuki, J. Matsuo
    “Comparative Study of Cluster SIMS and Other Techniques for Highly Accurate Organic Analysis”,
    SISS-17, The Scientific International Symposium on SIMS and Related Techniques
     Based on Ion-Solid Interactions, p. 63, (Seikei University, Tokyo, Japan, 2015/6/26) oral

  19. R. Shishido, M. Fujii, T. Seki, T. Aoki, J. Matsuo and S. Suzuki;
    “The Effect of Yield and Damage Cross-Section on Imaging Analysis of OrganicMaterials by
    Different Primary Bi Ions in TOF-SIMS”,
    SISS-17, The Scientific International Sympojium on SIMS and Related Techniques Based on
    Ion-Solid Interactions, p. 38, (Seikei University, Tokyo, Japan, 2015/6/25)poster

  20. Y. Yokoyama, M. Fujii, J. Matsuo, M. Kusakari and S. Aoyagi;
    “A study of the primary energy dependence of peptide fragmentation”,
    SISS-17, The Scientific International Sympojium on SIMS and Related Techniques Based on
    Ion-Solid Interactions, p. 65, (2015.6.26) @Seikei University, Tokyo, Japan, (oral).

  21. M. Kusakari, M. Fujii, T. Seki, T. Aoki and J. Matsuo;
    “A New Ambient Analysis using MeV-SIMS for Liquid-Solid Interface”,
     SISS-17, The Scientific International Sympojium on SIMS and Related Techniques Based on
    Ion-Solid Interactions, p. 67, (2015.6.26) @Seikei University, Tokyo, Japan, (oral).

  22. T.Satoh, H,.Niimi, M. Fujii, T. Seki, J.Matsuo, M.Ubukata,
    R.DiPasquale,
    “The laser desorption/ionization imaging mass spectrometry for synthetic polymer analysis
    assisted by metal nano-particles”, ASMS, (2015.6.3), (poster)

  23. K. Suzuki, M. Kusakari, M. Fujii, T. Seki, T. Aoki, and J. Matsuo;
    “Development of SIMS instruments with Focused Cluster Ion Beam Toward New Applications”,
    SISS-17, The Scientific International Symposium on SIMS and Related Techniques Based on
    Ion-Solid Interactions, p. 38, (2015.6.25) @Seikei University, Tokyo, Japan, (poster)

  24. J. Matsuo
    Secondary Ion Mass Spectrometric Analysis of Soft Materials - Current
    Challenges and Future Applications
    22nd International Conference on Ion Beam Analysis (IBA 2015)
    (Opatija, Croatia, 2015/6/16) Plenary

  25. T.Seki, M.Kusakari, M.Fujii, T.Aoki and JMatsuo,
    Ambient Analysis of Liquid Materials with Wet-SIMS
    22nd International Conference on Ion Beam Analysis (IBA 2015)
    (Opatija, Croatia, 2015/6/14) Oral

  26. M. Fujii, T. Seki ,T. Aoki, J. Matsuo
    Recent Progress and Future Prospects of Cluster SIMS for Biological Applications
    SISS-17 Satellite workshop
    (Kyoto,Japan,2015/6/29) Oral

  27. T. Seki, T. Aoki, A. Ishihara and J. Matsuo
    Imaging mass spectrometry with MeV-energy heavy ion beams
    XXII INTERNATIONAL CONFERENCE ON ION - SURFACE INTERACTIONS (ISI-2015)
    (Moscow,Russia,2015/8/21) Invited