2013-2014/2011-2012/2009-2010/2007-2008/2006-2005/2004-2003/2002-2001
Publications

2002
  1. N. Toyoda, J. Matsuo, T. Aoki, I. Yamada and D. B. Fenier
    gSecondary ion mass spectrometry with gas cluster ion beamsh
    Nuclear Instruments and Methods in Physics Research B, Vol.190 (2002) pp.860-864

  2. S. Ninomiya, N. Imanishi, J. Xue, S. Gomi, and M. Imai
    gMaterial-dependent emission mechanism of secondary atomic ions from solids under MeV-enrgy heavy ion bombardmenth,
    Nuclear Instruments and Methods in Physics Research B 193 (2002) pp. 745-750

2001
  1. T. Aoki, J. Matsuo, G. Takaoka and I. Yamada
    gMolecular Dynamics Simulations of Cluster Ion Impact on Diamond Surfaceh
    Proc. of Materials Research Society Symposium, Vol.650 (2001) pp.R3.40.1-R3.40.6

  2. T. Seki, K. Tsumura, T. Aoki, J. Matsuo, G. H.Takaoka and I. Yamada
    gAr Cluster Ion Bombardment Effects on Semiconductor Surfacesh
    Materials Science & Enbineering, Vol.647 (2001) pp.09.1.1.-09.4.6.

  3. I. Yamada, J. Matsuo, N.Toyoda and ADKirkpatrick
    "Materal Processing by Gas Cluster Ion Beams"
    Materials Science & Enbineering, Vol.R34 (2001) pp. 231-295

  4. N.Toyoda, J. Matsuo, T.Aoki, I.Yamada, D.B.Fenner,
    "Secondary Ion Mass Spectrometry with Gas Cluster Ion Beams"
    Nuclear Instruments and Methods B, Vol.190 (2001) pp. 860-864

  5. R.C. Birtcher, J. Matsuo and I. Yamada
    gCraters produced on Al, Cu and Au by Ar cluster impactsh
    Nuclear Instruments and Methods in Physics Research B, Vol.175/177 (2001) 36-39

  6. N. Toyoda, T. Aoki, J. Matsuo, I. Yamada, K. Wada and L. C. Kimerling
    gPhotoluminescence study of defects induced by B10H14 ionsh
    Proc. of Materials Research Society Symposium, Vol.669 (2001) J4.20.1

  7. T. Aoki, J. Matsuo and G. H. Takaoka
    gCharacterization of damage induced by cluster ion implantationh
    Proc. of Materials Research Society Symposium, Vol.669 (2001) J4.5.1

  8. S. Chiba, T. Aoki and J. Matsuo
    gMolecular dynamics simulation of fluorine ion etching of siliconh
    Nuclear Instruments and Methods in Physics Research B Vol.180 (2001) pp. 317-321

  9. T. Aoki, J. Matsuo and I. Yamada
    gCluster size effect on reactive sputtering by fluorine cluster impact using molecular dynamics simulationh
    Nuclear Instruments and Methods in Physics Research B Vol.180 (2001) pp. 164-170

  10. T. Aoki, S. Chiba, J. Matsuo, I. Yamada and J. P. Biersack
    gMolecular dynamics and Monte-Carlo simulation of sputtering and mixing by ion irradiationh
    Nuclear Instruments and Methods in Physics Research B Vol.180 (2001) pp. 312-316

  11. H. Biederman, D. Slavinska, H. Boldyreva, H. Lehmberg, G. Takaoka, J. Matsuo, H. Kinpara, and J. Zemek
    gModification of polycarbonate and polypropylene surfaces by argon ion cluster beamsh
    J. Vac. Sci. Technol. B19, Vol.2050 (2001) Full Text PDF (541 kB) Gzipped PS Order

  12. G. H. Takaoka, S. Nakamura, T. Seki and J. Matsuo
    gInteraction of SF6 Cluster Ion Beams with Si Surfaceh
    Jpn. J. Appl. Phys. Vol.40 (2001) pp. L1384- L1386: (H02, K09)

  13. S. Ninomiya, S. Gomi, J. Xue, M. Imai, and N. Imanishi
    gDependence of Heavy Ion Induced Secondary Ion Emission on Electric Conductivity in MeV Energy Rangeh Proceedings of 16th International Conference on Application of Accelerators in Research and Industry, (2001) pp. 543-547

  14. J. Xue, S. Ninomiya, S. Gomi, and N. Imanishi
    gMechanism of Secondary Ion Emission from an Al Sample under MeV Heavy Ion Bombardmenth, Proceedings of 16th International Conference on Application of Accelerators in Research and Industry, (2001) pp. 145-148.


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