2013-2014/2011-2012/2009-2010/2007-2008/2006-2005/2004-2003 /2002-2001
Publications

2006
  1. S. Ninomiya, K. Ichiki, Y. Nakata, T. Seki, T. Aoki, J. Matsuo
    gThe effect of incident cluster ion energy and size on secondary ion yields emitted from Sih
    Nuclear Instruments and Methods in Physics Research B, 256 (2007)pp. 528-531

  2. S. Ninomiya, Y. Nakata, K. Ichiki, T. Seki, T. Aoki, and J. Matsuo,
    gMeasurements of secondary ions emitted from organic compounds bombarded with large gas cluster ionsh,
    Nuclear Instruments and Methods in Physics Research B, 256 (2007)pp. 493-496

  3. Y. Nakata, S. Ninomiya, and J. Matsuo,
    gSecondary ion emission from bio-molecular thin films under ion bombardmenth,
    Nuclear Instruments and Methods in Physics Research B, 256 (2007)pp. 489-492


  4. K. Ichiki, S. Ninomiya, T. Seki, T. Aoki, and J. Matsuo,
    gSurface oxidation of Si assisted by irradiation with large gas cluster ion beam in an oxygen atmosphereh,
    Nuclear Instruments and Methods in Physics Research B, 256 (2007) pp. 350-353

  5. Takaaki Aoki, Jiro Matsuo,
    gMolecular dynamics study of surface modification with a glancing angle gas cluster ion beamh
    Nuclear Instruments and Methods in Physics Research B, Vol.255 (2007) pp.265-268

  6. T. Seki and J. Matsuo
    gHigh-Speed Nano-Processing with Cluster Ion Beamsh
    AIP Conf. Proc. 866, 214 (2006) (Proc. 16th International Conference on Ion Implantation Technology)

  7. S. Ninomiya, T.Aoki, T. Seki, J. Matsuo,
    gSecondary ion measurements for oxygen cluster ion SIMSh
    Appl.Surf.Sci. Vol.252 (2006) pp.7290-7292

  8. T. Aoki and J. Matsuo,
    gMolecular dynamics study of particle emission by reactive cluster ion impacth
    Appl.Surf.Sci. Vol.252 (2006) pp.6466-6469

  9. S. Ninomiya, T. Aoki, T. Seki and J. Matsuo
    gHigh-intensity Si cluster ion emission from a silicon target bombarded with large Ar cluster ionsh
    Applied Surface Science 252(2006) pp.6550-6553

2005
  1. T. Aoki and J. Matsuo
    hMolecular dynamics simulations of surface modification and damage formation by gas cluster ion impactsh
    Nuclear Instruments and Methods in Physics Research B, vol 242(2006) pp.517-519

  2. T. Seki, T. Murase, J. Matsuo
    gCluster size dependence of sputtering yield by cluster ion beam irradiationh
    Nuclear Instruments and Methods in Physics Research B, Vol.242(2006) pp.179-181


  3. C. Heck, T. Seki, T. Oosawa, M. Chikamatsu, N. Tanigaki, T. Hiraga, J. Matsuo
    gITO surface smoothing with argon cluster ion beamh
    Nuclear Instruments and Methods in Physics Research B, Vol.242 (2006) pp.140-142


  4. S. Kakuta, T. Seki, S. Sasaki, K. Furusawa, T. Aoki and J. Matsuo,
    gSize and energy distribution of gas cluster ion beam measured by energy resolved time of flight mass spectroscoph
    Surface and Coatings Technology, Vol. 196(2005) pp.198-202

  5. E. Bourelle, A. Suzuki, A. Sato, T. Seki and J. Matsuo
    gSidewall polishing with a gas cluster ion beam for photonic device applicationsh
    Nuclear Instruments and Methods in Physics Research B,Vol.230(2005) pp. 622-624

  6. T. Aoki and J. Matsuo
    gMolecular dynamics study of the angular dependence of reactive cluster impactsh Nuclear Instruments and Methods in Physics Research B, Vol.230(2005)pp. 594-598

  7. T. Seki and J. Matsuo
    gEnergy distributions of high current cluster ion beamsh
    Nuclear Instruments and Methods in Physics Research B, Vol.241(2005) pp. 604-608

  8. Y. Nakata, S. Ninomiya, C. Imada, M. Nagai, T. Aoki, J. Matsuo and N. Imanishi
    gSecondary neutral and ionized particle measurements under MeV-energy ion bombardmenth
    Nuclear Instruments and Methods in Physics Research B, Vol.230(2005) pp.489-494

  9. S. Ninomiya, C. Imada, M. Nagai, Y. Nakata, T. Aoki, J. Matsuo and N. Imanishi
    gTotal sputtering yields of solids under MeV-energy Si ion bombardmenh
    Nuclear Instruments and Methods in Physics Research B, Vol.230(2005) pp.483-488

  10. J. Matsuo, S. Ninomiya, T. Aoki, and T. Seki
    gLarge Cluster Ions as Projectiles for SIMS-Opportunities and Challengesh
    Proceedings of 18th Annual Workshop on SIMS, (2005) pp. 29-32


  11. Y. Nakata, S. Ninomiya, T. Aoki, H. Tsuchida, J. Matsuo and A. Itoh
    gA Comparison of Ions with Neutrals Emitted from Semiconductors Bombarded by MeV Si Ionsh
    Transactions of the Materials Research Society of Japan 30[3] (2005) pp. 797-800



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