2013-2014/2011-2012/2009-2010/2007-2008/2006-2005/2004-2003 /2002-2001
Publications

2012


  1. M. Hada, D. Zhang, A. Casandruc, R.J.D. Miller, Y. Hontani, J. Matsuo,R.E. Marvel and R.F. Haglund Jr.
    "Hot electron injection driven phase transitions"
    Physical. Review. B 86, 134101 (2012, Oct.) (doi:10.1103/PhysRevB.86.134101)

  2. T. Aoki, T. Seki and J. Matsuo
    gMolecular dynamics study of crater formation by core-shell structured cluster impacth
    Nuclear Instruments and Methods in Physics Research B, 282, pp.29-32 (2012, Jul.) (doi:10.1016/j.nimb.2011.08.061)

  3. Yasuyuki Yamamoto, Kazuya Ichiki, Toshio Seki, Takaaki Aoki and Jiro Matsuo
    gIon-induced damage evaluation with Ar cluster ion beamsh
    Surface and Interface Analysis Vol. 45 pp.167-170 (2012, Jun.) (doi: 10.1002/sia.5014)

  4. M. Hada and J. Matsuo
    gUltrafast X-ray sources for time-resolved measurementsh
    X-Ray Spectrom., 41, pp.188-194 (2012, Jun.) (doi: 10.1002/xrs.2401)

  5. J. Matsuo, K. Ichiki, Y. Yamamoto, T. Seki and T. Aoki
    gDepth profiling analysis of damaged arginine films with Ar cluster ion beamsh
    Surface and Interface Analysis Vol. 44 [6], pp.729-731 (2012, Jun.) (doi: 10.1002/sia.4856)

  6. Hubert Gnaser, Kazuya Ichiki and Jiro Matsuo
    gSputtered ion emission under size-selected Arn+ cluster ion bombardmenth
    Surface and Interface Analysis Vol. 45 pp. 138-142 (2012, Feb.) (doi: 10.1002/sia.4914)

2011
  1. G. Moriena, M. Hada, G. Sciaini, J. Matsuo and R.J.D. Miller
    gFemtosecond electron diffraction: Preparation and characterization of (110)-oriented bismuth filmsh
    J. Appl. Phys. 111, 043504 (2012, Feb. 16) (doi: 10.1063/1.3684975)


  2. H. Gnaser, K. Ichiki and J. Matsuo
    gStrongly reduced fragmentation and soft emission processes in sputtered ion formation from amino acid films under large Arn+ (n ≤ 2200) cluster ion bombardmenth
    Rapid Communications in Mass Spectrometry Vol. 26, Issue 1, pp.1-8 (2012, Jan. 15) (doi: 10.1002/rcm.5286)


  3. T. Seki, T. Aoki and J. Matsuo
    gEtching of metallic materials with Cl2 gas cluster ion beamh
    Surface & Coatins Technology 206 Issues 5, pp. 789-791 (2011, Nov. )
    (doi:10.1016/j.surfcoat.2011.04.054)

  4. M. Hada, S. Ibuki, Y. Hontani, Y. Yamamoto, K. Ichiki, S. Ninomiya, T. Seki, T. Aoki, J. Matsuo
    gLow Damage Milling of an Amino Acid thin film with Cluster Ion Beamh
    J. Appl. Phys., 110, 094701 (2011, )

  5. Y. Wakamatsu, H. Yamada, S. Ninomiya, B. N. Jones, T. Seki, T. Aoki, R. Webb and J. Matsuo
    gHighly sensitive molecular detection with swift heavy ionsh
    Nuclear Instruments and Methods in Physics Research B, 269, pp. 2251-2253, (2011, Oct.) (doi:10.1016/.nimb.2011.02.069)


  6. K. Ichiki, S. Ninomiya, T. Seki, , T. Aoki and J. Matsuo
    gThe effects of cluster size on sputtering and surface smoothing of PMMA with gas cluster ion beamsh
    Transactions of the MRS-J 36[3] pp. 309-312(2011, Sep.)


  7. Y. Yamamoto, K. Ichiki, T. Seki, T. Aoki and J. Matsuo
    gEvaluation of damage depth on arginine films with molecular depth profiling by Ar cluster ion beamh
    Transactions of the MRS-J 36[3] pp. 313-316(2011, Sep.)


  8. T. Aoki, T. Seki and J. Matsuo
    gMolecular dynamics study of crater formation by core-shell structured cluster impacth
    Nuclear Instruments and Methods in Physics Research B, In Press (2011, Sep.) (doi: 10.1016/j.nimb.2011.08.061)

  9. M. Hada, K. Okimura and J. Matsuo
    gPhoto-induced lattice softening of excited-state VO2h
    Appl. Phys. Lett. 99, 051903 (2011, Aug.)(DOI: 10.1002/sia.3587)


  10. T. Aoki, T. Seki and J. Matsuo
    gMolecular dynamics simulations of large fluorine cluster impact on silicon with supersonic velocityh
    Nuclear Instruments and Methods in Physics Research B, 269, pp. 1582-1585, (2011, July)
    (doi:10.1016/j.nimb.2010.12.013)

  11. M. Hada, J. Matsuo
    gEvaluation of lattice motion in CdTe single crystal using in-air tabletop time-resolved X-ray diffractometerh
    IOP Conf. Ser.: Mater. Sci. Eng. 24 012010 (2011)(doi: 10.1088/1757-899X/24/1/012010)